X-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis equipment both generate high intensity ionizing radiation that can cause severe and permanent injury if any body is exposed to the primary ...
The study, led by Sophie Parsons, a UCSD graduate student participating in LLNL's Academic Cooperation Program, utilized X-ray diffraction data that was previously collected by LLNL scientists ...
Formerly, such measurements required large X-ray analytical equipment; with the arrival of the XSPA-200 ER, the analysis can be performed using desktop X-ray analyzers such as the MiniFlex.
Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction ...