Another recent application of ion milling is found in focused ion beam (FIB) systems, predominantly in semiconductor fabrication. These systems operate similarly to SEMs. However, they emit a focused ...

This illustration shows the Focused Ion Beam (FIB) milling process, a precise method for shaping materials on a nanoscale. A focused beam of gallium ions (depicted as a blue arrow) sculpts a surface ...

The new contract aims to develop "foundational" ultra-wide-bandgap semiconductors using diamond and aluminum nitride. This ...

Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them ...