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ROHM Gen 4: A Technical Review - EE Times Asia
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Identification of subsurface damage of 4H-SiC wafers by combining photo-chemical etchin…
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(a) SEM image of cluster of SiC particles growing on Si 3 N 4 rod. (b)... | Download Scientific ...
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Figure 1 from SiC MOSFET robustness to ESD study: Co…
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SEM micrographs of the SiC thin films. A) SiC deposited on Si at room... | Download Scienti…
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SEM of (a) SiC, (b) Al, (c) Ti and (d) 80 wt% SiC-10 wt%Ti-10 wt% | Download Scientific Diagram
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SEM images of the 3C-SiC products with different magnifications. | Dow…
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SEM images of SiC films deposited at 750 °C using a RB-SiC and b... | Download Scientific Diagram
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SEM and TEM images of the as-prepared cubic SiC (a–c) and B-doped cubic... | Dow…
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